Instruments by Function
Imaging provides surface spatial information. This could be morphological as in the case of scanning probe microscopy or chemical as in the case of Raman microscopy.
Elemental analysis provides information about the various elements present in a sample as in the case of laser ablation mass spectrometry and in some cases the oxidation state as in the case of x-ray photoelectron spectroscopy.
Identification of a material often requires information about atomic arrangement as in the case of x-ray diffraction or chemical bonding as in the case of infrared or nuclear magnetic resonance spectroscopy.
Thin film & nanoparticle characterization can provide information of thickness and size. For example, dynamic light scattering will provide average particle size of particles in a suspension and ellipsometry can provide film thickness and dielectric constant.
Structural information can be obtained ranging from ordering at the atomic level with standard x-ray diffraction up to larger-scale molecular structures with wide angle x-ray diffraction.
Bulk properties of materials can be obtain including magnetic properties, dielectric constant, conductivity and hardness.
IMAGING
Electron Microscopy
Hitachi S-4700 FE Scanning Electron Microscope
Comments: Magnifications up to approx 500,000x, secondary and back-scattered electron image formation, X-ray spectra/mapping (EDS, for Z > 5), digital image acquisition, coating units (gold and carbon).
Contact: Dr. Eric Moreau, Mechanical Engineering
JEOL JXA-8200 Electron Probe Micro-Analyzer
Contact: D. J. MacDonald, Robert M. MacKay Electron Microprobe Lab, Earth Sciences
ZEISS/LEO 1455vp Variable Pressure Scanning Electron Microscope
Comments: large specimen chamber
Contact: Dr. Ping Li, Scientific Imaging Suite, Department of Biology
FEI, Tecnai 12 Transmission Electron Microscope
Comments: 120 kv; 300 kx; Gatan 832 SC1000 11M pixels (4008 x 2672) CCD camera
Contact: Dr. Ping Li, Scientific Imaging Suite, Department of Biology
Optical Microscopy
Optical Microscope
Comments: up to 1000x, bright/dark field, polarized light, interference contrast, Nemarski contrast, oil immersion lenses, Polaroid, 35 mm and digital image acquisition (black and white).
Contact: Dr. Kevin Plucknett, Mechanical Engineering
Keyence VK-X1000 - 3D Confocal Laser Scanning Microscope (CLSM)
Comments: Non-contact profile, roughness and film thickness measurements, nanometer resolution, material and shape independent. Fully automatic measurement and analysis.
Contact: Dr. Eric Moreau, Mechanical Engineering
LSM-410-Carl Zeiss Confocal laser scanning microscope
Comments: ; fluorescence (3 laser lines: 488nm, 568nm, 647nm), optical sectioning, digital imaging, 3D reconstruction, inverted microscope
Contact: Dr. Ping Li, Scientific Imaging Suite, Department of Biology
Other
Bruker Bioscope Catalyst Atomic Force Microscope with Horiba Raman Spectrometer
Comments: 100 microns XY scanner; 22 microns Z-range.
Contact: Dr. Laurent Kreplak, Physics & Atmospheric Science
ELEMENTAL ANALYSIS
Hitachi S-4700 FE Scanning Electron Microscope
Comments: Magnifications up to approx 30,000x, secondary and back-scattered electron image formation, X-ray spectra/mapping (EDS, for Z > 5), Polaroid and digital image acquisition, coating units (gold and carbon).
Contact: Dr. Eric Moreau, Mechanical Engineering
JEOL JXA-8200 Electron Probe Micro-Analyzer
Contact: D. J. MacDonald, Robert M. MacKay Electron Microprobe Lab, Earth Sciences
VG Microtech MultiLab ESCA 2000 X-ray Photoelectron Spectrometer (XPS)
Contact: Andrew George, Physics and Atmospheric Science
Bruker Compact QTOF Mass Spectrometer
Comments: m/z range of 20-39000; ESI, APCI, APPI, Solid probe and Captive spray sources.
Contact: Xiao Feng, Mass Spectrometry Laboratory, Chemistry
IDENTIFICATION
Nicolet NXR 9650 FT-Raman spectrometer
Comment: Nd: YVO4 1064 nm laser; spectral range: 4000 cm-1 to 50 cm-1; variable temperature cell (-150 to 150 °C); depolarization accessory.
Contact: Mike Johnson
VG Microtech MultiLab ESCA 2000 X-ray Photoelectron Spectrometer (XPS)
Contact: Andrew George, Physics and Atmospheric Science
Bruker AV-III 700 MHz NMR spectrometer
Comments: ; multi-nuclear NMR for solids, range from 87Sr -31P, H/F, for 2.5mm, 3.2mm and 4mm rotors with dual and triple resonance MAS probe heads.
Contact: Dr. Ulrike Werner-Zwanziger, Nuclear Magnetic Resonance Resource (NMR-3), Chemistry
Bruker Avance DSX 400 NMR spectrometer
Comments: ; multi-nuclear NMR for solids, range from 15N -31P, H/F, for 2.5mm, 4mm and 7mm rotors with dual and triple resonance MAS probe heads, and wideline capabilities.
Contact: Dr. Ulrike Werner-Zwanziger, Nuclear Magnetic Resonance Resource (NMR-3), Chemistry
Bruker AV 300 NMR spectrometer
Comments: ; multinuclear NMR of liquids.
Contact: Dr. Mike Lumsden, Nuclear Magnetic Resonance Resource (NMR-3), Chemistry
Bruker AV 500 NMR spectrometer
Comments: ; multinuclear NMR of liquids.
Contact: Dr. Mike Lumsden, Nuclear Magnetic Resonance Resource (NMR-3), Chemistry
Bruker micTOF Mass spectrometer
Comments: APCI/MS, ESI/MS, LC/MS with either APCI or ESI, and high-resolution ESI or APCI, accurate mass determination.
Contact: Xiao Feng, Mass Spectrometry Laboratory, Chemistry
Bruker Compact QTOF Mass Spectrometer
Comments: m/z range of 20-39000; ESI, APCI, APPI, Solid probe and Captive spray sources.
Contact: Xiao Feng, Mass Spectrometry Laboratory, Chemistry
VG/Micromass Quattro Mass spectrometer
Comments: triple quadrupole mass spectrometer; EI/MS, CI/MS, APCI/MS, ESI/MS, GC/MS with either EI or CI, LC/MS with either APCI or ESI, MS/MS.
Contact: Xiao Feng, Mass Spectrometry Laboratory, Chemistry
AB SCIEX API 2000 QTRAP Mass Spectrometer
Comments: triple quadrupole;
Contact: Xiao Feng, Mass Spectrometry Laboratory, Chemistry
Thermo Finnigan LCQ Duo Mass spectrometer
Comments: Ion Trap mass spectrometer; APCI/MS, ESI/MS, flow injection MS with either APCI or ESI, LC/MS with either APCI or ESI, MS/MS.
Contact: Xiao Feng, Mass Spectrometry Laboratory, Chemistry
THIN FILM & NANOCHARACTERIZATION
VG Microtech MultiLab ESCA 2000 X-ray Photoelectron Spectrometer (XPS)
Contact: Andrew George, Physics and Atmospheric Science
STRUCTURAL INFORMATION
Bruker D8 Advance High Speed X-ray Diffractometer
Comments: Bruker D8 Advance XRD System [PDF - 128kB]
Contact: Dr. Zoheir Farhat, Mechanical Engineering
Siemens D500 Powder X-ray Diffractometer
Comments: structural analysis of powdered samples (4K to room temperature).
Contact: Andy George, Physics & Atmospheric Science
Powder x-ray diffraction and JCPDS datafile
Contact: Dr. Jeff Dahn, Physics & Atmospheric Science
Bruker Avance 700 MHz NMR spectrometer
Comments: ; multi-nuclear NMR for solids, range from 87Sr -31P, H/F, for 2.5mm, 3.2mm and 4mm rotors with dual and triple resonance MAS probe heads.
Contact: Dr. Ulrike Werner-Zwanziger, Nuclear Magnetic Resonance Resource (NMR-3), Chemistry
Bruker Avance DSX 400 NMR spectrometer
Comments: ; multi-nuclear NMR for solids, range from 15N -31P, H/F, for 2.5mm, 4mm and 7mm rotors with dual and triple resonance MAS probe heads, and wideline capabilities.
Contact: Dr. Ulrike Werner-Zwanziger, Nuclear Magnetic Resonance Resource (NMR-3), Chemistry
Bruker AV 300 NMR spectrometer
Comments: ; multinuclear NMR of liquids.
Contact: Dr. Mike Lumsden, Nuclear Magnetic Resonance Resource (NMR-3), Chemistry
Bruker AV 500 NMR spectrometer
Comments: multinuclear NMR of liquids.
Contact: Dr. Mike Lumsden, Nuclear Magnetic Resonance Resource (NMR-3), Chemistry
Bruker AV-III 700 MHz spectrometer
Comments: 5 mm and 1.7 mm TCI cryoprobes
Contact: Dr. Mike Lumsden, Nuclear Magnetic Resonance Resource (NMR-3), Chemistry
BULK PROPERTIES
JD Lemmens Grindosonic
Comments: measures the elastic propoerties of a wide range of materials
Contact: Dr. Farid Taheri, Mechanical Engineering
Bruker D8 Advance High Speed X-ray Diffractometer
Comments: Bruker D8 Advance XRD System [PDF - 128kB]
Contact: Dr. Zoheir Farhat, Mechanical Engineering
Siemens D500 Powder X-ray Diffractometer
Comments: structural analysis of powdered samples (4K to room temperature).
Contact: Andy George, Physics & Atmospheric Science
Powder x-ray diffraction and JCPDS datafile
Contact: Dr. Jeff Dahn, Physics & Atmospheric Science
TA Instrument Q200 Differential Scanning Calorimeter
Comments: Temperature range of -170˚C to 500˚C
Contact: Mike Johnson
Netzsch LFA 427 High Temperature Laser Flash Thermal Diffusivity Apparatus
Contact: Dr. Stephen Corbin, Mechanical Engineering
Bruker Avance 700 MHz NMR spectrometer
Comments: ; multi-nuclear NMR for solids, range from 87Sr -31P, H/F, for 2.5mm, 3.2mm and 4mm rotors with dual and triple resonance MAS probe heads.
Contact: Dr. Ulrike Werner-Zwanziger, Nuclear Magnetic Resonance Resource (NMR-3), Chemistry
Bruker Avance DSX 400 NMR spectrometer
Comments: multi-nuclear NMR for solids, range from 15N -31P, H/F, for 2.5mm, 4mm and 7mm rotors with dual and triple resonance MAS probe heads, and wideline capabilities.
Contact: Dr. Ulrike Werner-Zwanziger, Nuclear Magnetic Resonance Resource (NMR-3), Chemistry
Netzsch 404 F1 Pegasus Differential Scanning Calorimeter
Comments: Pt furnace (RT to 1500°C), Turbomolecular vacuum pump + high purity inert gasses
Contact: Dr. Eric Moreau, Mechanical Engineering
Netzsch 427 Laser Flash Apparatus
Comments:SiC furnace (RT to 1550 °C), Turbomolecular vacuum pump + high purity inert gasses. Full melting capabilities.
Contact: Dr. Eric Moreau, Mechanical Engineering
Netzsch STA 449 F1 Simultaneous Thermal Analyser (Differential Scanning Calorimetry + Thermogravimetric Analysis) with GCMS
Comments: SiC furnace RT to 1550 C and Silver furnace -120 to 675 C. In-line Agilent technologies 7820A gas chromatography + 5975 mass spectrometer for evolved gas analysis. Contact: Dr. Eric Moreau, Mechanical Engineering